TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_19_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-012-12 | FUSED_ID : 6359364768384434380
  IC_TEMP :  -82.26 | VDDM : 1110.95 | AUX_INT :  -43.08 | CsaBias :   31.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.55846e-03 / 2
  ADC_P0  : -4.30796e-02 ± 4.28898e-02
  ADC_P1  : 9.37599e-03 ± 1.07298e-03
  ADC_P2  : -8.44959e-06 ± 5.38114e-06
  CSA_Chi2/NDF : 1.59232e-04 / 2
  CSA_P0  : 5.86360e-02 ± 8.41661e-03
  CSA_P1  : 9.79504e-03 ± 6.34131e-04
  CSA_P2  : -5.96176e-05 ± 9.65706e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 7, 16, 37, 50, 62, 63, 69, 99, 100, 106, 113, 116, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [6, 14, 18, 45, 47, 49, 59, 64, 72, 83, 87, 91, 93, 94, 104, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1334', '1.800', '0.1435', '1.800', '0.0901', '7.000', '0.7077', 1, 1, 1, 1, 1724314762.5697398]
VI_after__Init : ['1.201', '0.1334', '1.800', '0.1436', '1.799', '0.0844', '7.000', '0.7078', 1, 1, 1, 1, 1724314770.6610918]
VI_at__the_End : ['1.201', '0.4340', '1.800', '0.1314', '1.803', '0.1261', '7.000', '0.7085', 1, 1, 1, 1, 1724314829.9826298]