TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_20_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-013-12 | FUSED_ID : 6359364768384434396
  IC_TEMP :  -92.01 | VDDM : 1128.96 | AUX_INT :  -10.36 | CsaBias :   45.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66003e-03 / 2
  ADC_P0  : -1.03570e-02 ± 2.75780e-02
  ADC_P1  : 9.43586e-03 ± 7.41213e-04
  ADC_P2  : -8.17270e-06 ± 3.96274e-06
  CSA_Chi2/NDF : 1.57146e-04 / 2
  CSA_P0  : 6.09244e-02 ± 8.36130e-03
  CSA_P1  : 1.04574e-02 ± 6.29963e-04
  CSA_P2  : -6.96470e-05 ± 9.59360e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 10, 39, 50, 56, 63, 72, 79, 86, 105, 109, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [9, 17, 19, 29, 44, 45, 52, 60, 87, 89, 108, 114, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3494', '1.800', '0.1294', '1.800', '0.1010', '7.000', '0.7074', 1, 1, 1, 1, 1724314858.6222928]
VI_after__Init : ['1.201', '0.3502', '1.800', '0.1297', '1.801', '0.0951', '7.000', '0.7076', 1, 1, 1, 1, 1724314866.7587368]
VI_at__the_End : ['1.201', '0.4392', '1.800', '0.1336', '1.799', '0.1277', '7.000', '0.7083', 1, 1, 1, 1, 1724314933.741677]