TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_24_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-015-12 | FUSED_ID : 6359364768384434428
  IC_TEMP :  -75.47 | VDDM : 1116.39 | AUX_INT :  -11.71 | CsaBias :   50.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.11603e-03 / 2
  ADC_P0  : -1.17057e-02 ± 3.12321e-02
  ADC_P1  : 8.93263e-03 ± 8.08879e-04
  ADC_P2  : -6.24844e-06 ± 4.20838e-06
  CSA_Chi2/NDF : 1.60577e-04 / 2
  CSA_P0  : 5.97380e-02 ± 8.45209e-03
  CSA_P1  : 1.05861e-02 ± 6.36804e-04
  CSA_P2  : -6.78772e-05 ± 9.69777e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 6, 13, 46, 57, 58, 63, 85, 92, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [10, 13, 22, 35, 38, 50, 60, 83, 87, 114, 115, 120, 123, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3367', '1.800', '0.1339', '1.799', '0.1014', '7.000', '0.7075', 1, 1, 1, 1, 1724315050.228767]
VI_after__Init : ['1.201', '0.3369', '1.800', '0.1341', '1.800', '0.0955', '7.000', '0.7079', 1, 1, 1, 1, 1724315058.2362478]
VI_at__the_End : ['1.201', '0.4525', '1.800', '0.1343', '1.804', '0.1226', '7.000', '0.7082', 1, 1, 1, 1, 1724315119.5225503]