TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_25_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-016-11 | FUSED_ID : 6359364768384434443
  IC_TEMP :  -84.56 | VDDM : 1121.09 | AUX_INT :  -10.13 | CsaBias :   53.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56871e-03 / 2
  ADC_P0  : -1.01254e-02 ± 2.68301e-02
  ADC_P1  : 9.18743e-03 ± 7.11744e-04
  ADC_P2  : -7.17545e-06 ± 3.76431e-06
  CSA_Chi2/NDF : 1.50150e-04 / 2
  CSA_P0  : 6.04694e-02 ± 8.17306e-03
  CSA_P1  : 1.05357e-02 ± 6.15781e-04
  CSA_P2  : -6.99351e-05 ± 9.37762e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [17, 41, 44, 59, 60, 69, 73, 78, 85, 105, 109, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [5, 52, 55, 58, 67, 69, 72, 75, 99, 109, 121, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3208', '1.800', '0.1195', '1.800', '0.0963', '7.000', '0.7073', 1, 1, 1, 1, 1724315145.9195356]
VI_after__Init : ['1.202', '0.3213', '1.800', '0.1204', '1.801', '0.0904', '7.000', '0.7075', 1, 1, 1, 1, 1724315153.925965]
VI_at__the_End : ['1.201', '0.4426', '1.800', '0.1346', '1.803', '0.1260', '7.000', '0.7081', 1, 1, 1, 1, 1724315217.8650312]