TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_30_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-019-11 | FUSED_ID : 6359364768384434491
  IC_TEMP :  -78.57 | VDDM : 1128.59 | AUX_INT :   -9.13 | CsaBias :   52.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26872e-03 / 2
  ADC_P0  : -9.13364e-03 ± 2.40766e-02
  ADC_P1  : 8.78379e-03 ± 6.05289e-04
  ADC_P2  : -7.10342e-06 ± 3.01718e-06
  CSA_Chi2/NDF : 1.90535e-04 / 2
  CSA_P0  : 5.79666e-02 ± 9.20681e-03
  CSA_P1  : 1.00919e-02 ± 6.93667e-04
  CSA_P2  : -6.03662e-05 ± 1.05637e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [15, 18, 27, 36, 54, 62, 72, 95, 96, 102, 111, 112, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [11, 13, 18, 20, 23, 32, 62, 69, 86, 99, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3045', '1.800', '0.1276', '1.800', '0.0968', '7.000', '0.7079', 1, 1, 1, 1, 1724315433.639513]
VI_after__Init : ['1.201', '0.3047', '1.800', '0.1276', '1.801', '0.0889', '7.000', '0.7075', 1, 1, 1, 1, 1724315441.767074]
VI_at__the_End : ['1.202', '0.4504', '1.800', '0.1323', '1.807', '0.1228', '7.000', '0.7081', 1, 1, 1, 1, 1724315509.5108328]