TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_35_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-022-11 | FUSED_ID : 6359364768384434539
  IC_TEMP :  -70.93 | VDDM : 1126.45 | AUX_INT :   -9.46 | CsaBias :   51.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43801e-03 / 2
  ADC_P0  : -9.46295e-03 ± 2.56814e-02
  ADC_P1  : 8.80029e-03 ± 6.53714e-04
  ADC_P2  : -6.66502e-06 ± 3.30909e-06
  CSA_Chi2/NDF : 2.19836e-04 / 2
  CSA_P0  : 5.77833e-02 ± 9.88943e-03
  CSA_P1  : 1.07171e-02 ± 7.45097e-04
  CSA_P2  : -6.58200e-05 ± 1.13469e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [7, 33, 38, 62, 68, 72, 80, 96, 100, 119, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  23
 | P_BROKEN_FAST :  [3, 4, 7, 10, 17, 19, 21, 28, 47, 52, 55, 57, 73, 75, 76, 80, 92, 103, 106, 108, 119, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3652', '1.800', '0.1529', '1.800', '0.0957', '7.000', '0.7075', 1, 1, 1, 1, 1724315714.5022297]
VI_after__Init : ['1.201', '0.3657', '1.800', '0.1536', '1.799', '0.0903', '7.000', '0.7072', 1, 1, 1, 1, 1724315722.5496259]
VI_at__the_End : ['1.202', '0.4693', '1.800', '0.1392', '1.800', '0.1216', '7.000', '0.7082', 1, 1, 1, 1, 1724315780.6122057]