TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_36_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-023-11 | FUSED_ID : 6359364768384434555
  IC_TEMP :  -80.09 | VDDM : 1119.85 | AUX_INT :  -10.78 | CsaBias :   61.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67672e-03 / 2
  ADC_P0  : -1.07760e-02 ± 2.77061e-02
  ADC_P1  : 9.06324e-03 ± 7.14798e-04
  ADC_P2  : -7.40841e-06 ± 3.68057e-06
  CSA_Chi2/NDF : 2.28448e-04 / 2
  CSA_P0  : 5.65777e-02 ± 1.00813e-02
  CSA_P1  : 1.05545e-02 ± 7.59553e-04
  CSA_P2  : -6.91840e-05 ± 1.15671e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 11, 54, 55, 57, 75, 81, 82, 83, 92, 93, 106, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [1, 7, 18, 23, 24, 33, 36, 85, 87, 95, 98, 104, 111, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3143', '1.800', '0.1246', '1.800', '0.1037', '7.000', '0.7071', 1, 1, 1, 1, 1724315809.959957]
VI_after__Init : ['1.202', '0.3148', '1.800', '0.1247', '1.799', '0.0979', '7.000', '0.7072', 1, 1, 1, 1, 1724315818.0842688]
VI_at__the_End : ['1.201', '0.4465', '1.800', '0.1350', '1.799', '0.1265', '7.000', '0.7079', 1, 1, 1, 1, 1724315883.9862678]