TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_02_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-005-010-01 | FUSED_ID : 6359364768384438433
  IC_TEMP :  -82.18 | VDDM : 1123.39 | AUX_INT :  -10.61 | CsaBias :   59.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76034e-03 / 2
  ADC_P0  : -1.06104e-02 ± 2.84457e-02
  ADC_P1  : 8.87868e-03 ± 7.29107e-04
  ADC_P2  : -6.63377e-06 ± 3.73034e-06
  CSA_Chi2/NDF : 1.95288e-04 / 2
  CSA_P0  : 5.85340e-02 ± 9.32096e-03
  CSA_P1  : 1.08001e-02 ± 7.02267e-04
  CSA_P2  : -7.28835e-05 ± 1.06947e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [9, 10, 11, 26, 55, 57, 59, 71, 85, 99, 105, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [9, 16, 49, 53, 57, 60, 62, 68, 83, 89, 94, 103, 104, 115, 119, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1305', '1.800', '0.1531', '1.800', '0.0897', '7.000', '0.7073', 1, 1, 1, 1, 1724317341.543604]
VI_after__Init : ['1.201', '0.1305', '1.800', '0.1532', '1.801', '0.0839', '7.000', '0.7073', 1, 1, 1, 1, 1724317349.5570555]
VI_at__the_End : ['1.201', '0.4481', '1.800', '0.1324', '1.799', '0.1226', '7.000', '0.7080', 1, 1, 1, 1, 1724317418.0488727]