TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_59_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-005-012-01 | FUSED_ID : 6359364768384438465
  IC_TEMP :  -75.57 | VDDM : 1115.79 | AUX_INT :  -10.07 | CsaBias :   56.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58948e-03 / 2
  ADC_P0  : -1.00719e-02 ± 2.70130e-02
  ADC_P1  : 8.35921e-03 ± 6.51791e-04
  ADC_P2  : -5.98104e-06 ± 3.13244e-06
  CSA_Chi2/NDF : 1.57596e-04 / 2
  CSA_P0  : 5.73129e-02 ± 8.37327e-03
  CSA_P1  : 1.03242e-02 ± 6.30865e-04
  CSA_P2  : -6.38045e-05 ± 9.60733e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [4, 11, 19, 22, 28, 33, 51, 57, 62, 66, 71, 75, 83, 86, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 11, 53, 64, 67, 93, 103, 112, 118, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3736', '1.800', '0.1662', '1.800', '0.0987', '7.000', '0.7077', 1, 1, 1, 1, 1724317149.6319842]
VI_after__Init : ['1.201', '0.3743', '1.800', '0.1676', '1.799', '0.0929', '7.000', '0.7076', 1, 1, 1, 1, 1724317157.7423358]
VI_at__the_End : ['1.201', '0.4501', '1.800', '0.1326', '1.803', '0.1245', '7.000', '0.7081', 1, 1, 1, 1, 1724317221.3145847]