TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_54_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-005-015-01 | FUSED_ID : 6359364768384438513
  IC_TEMP :  -74.80 | VDDM : 1121.21 | AUX_INT :   -9.13 | CsaBias :   54.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49642e-03 / 2
  ADC_P0  : -9.13407e-03 ± 2.62085e-02
  ADC_P1  : 9.16308e-03 ± 6.94537e-04
  ADC_P2  : -7.41803e-06 ± 3.64773e-06
  CSA_Chi2/NDF : 1.64123e-04 / 2
  CSA_P0  : 6.07078e-02 ± 8.54491e-03
  CSA_P1  : 1.05554e-02 ± 6.43797e-04
  CSA_P2  : -6.68408e-05 ± 9.80427e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [8, 13, 22, 25, 29, 34, 49, 54, 59, 60, 62, 70, 81, 85, 89, 98, 106, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 17, 19, 32, 42, 46, 47, 49, 65, 71, 79, 83, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4135', '1.800', '0.1443', '1.800', '0.1032', '7.000', '0.7078', 1, 1, 1, 1, 1724316862.6032488]
VI_after__Init : ['1.201', '0.4144', '1.800', '0.1455', '1.801', '0.0975', '7.000', '0.7079', 1, 1, 1, 1, 1724316870.7376983]
VI_at__the_End : ['1.201', '0.4566', '1.800', '0.1355', '1.799', '0.1239', '7.000', '0.7085', 1, 1, 1, 1, 1724316931.800187]