TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_38_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-005-025-06 | FUSED_ID : 6359364768384438678
  IC_TEMP :  -80.72 | VDDM : 1119.21 | AUX_INT :  -10.66 | CsaBias :   44.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67276e-03 / 2
  ADC_P0  : -1.06649e-02 ± 2.76830e-02
  ADC_P1  : 9.23944e-03 ± 7.30048e-04
  ADC_P2  : -7.62283e-06 ± 3.84125e-06
  CSA_Chi2/NDF : 1.53616e-04 / 2
  CSA_P0  : 5.94882e-02 ± 8.26685e-03
  CSA_P1  : 1.07135e-02 ± 6.22847e-04
  CSA_P2  : -6.87118e-05 ± 9.48523e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [5, 10, 15, 44, 52, 62, 68, 75, 81, 88, 105, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [0, 2, 3, 7, 19, 27, 29, 33, 65, 77, 84, 85, 91, 104, 108, 111, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1545', '1.800', '0.1431', '1.799', '0.0926', '7.000', '0.7071', 1, 1, 1, 1, 1724315905.6085844]
VI_after__Init : ['1.202', '0.1545', '1.800', '0.1431', '1.802', '0.0869', '7.000', '0.7071', 1, 1, 1, 1, 1724315914.4629781]
VI_at__the_End : ['1.201', '0.4585', '1.800', '0.1350', '1.799', '0.1235', '7.000', '0.7079', 1, 1, 1, 1, 1724315981.1348634]