TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_29_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-013-15 | FUSED_ID : 6359364768384442591
  IC_TEMP :  -65.09 | VDDM : 1115.44 | AUX_INT :   -8.99 | CsaBias :   59.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68297e-03 / 2
  ADC_P0  : -8.98813e-03 ± 2.79098e-02
  ADC_P1  : 8.58087e-03 ± 7.18721e-04
  ADC_P2  : -5.01912e-06 ± 3.68956e-06
  CSA_Chi2/NDF : 1.64786e-04 / 2
  CSA_P0  : 6.08710e-02 ± 8.56214e-03
  CSA_P1  : 1.03371e-02 ± 6.45096e-04
  CSA_P2  : -5.94015e-05 ± 9.82404e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 5, 12, 17, 18, 34, 42, 45, 50, 66, 80, 84, 92, 98, 99, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 13, 20, 26, 56, 64, 72, 80, 87, 95, 99, 109, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4047', '1.800', '0.1538', '1.799', '0.0970', '7.000', '0.7079', 1, 1, 1, 1, 1724318962.7489743]
VI_after__Init : ['1.201', '0.4050', '1.799', '0.1539', '1.801', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1724318970.7972581]
VI_at__the_End : ['1.201', '0.4718', '1.800', '0.1401', '1.806', '0.1195', '7.000', '0.7084', 1, 1, 1, 1, 1724319039.7705367]