TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_30_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-014-15 | FUSED_ID : 6359364768384442607
  IC_TEMP :  -66.40 | VDDM : 1119.77 | AUX_INT :   -9.37 | CsaBias :   50.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52704e-03 / 2
  ADC_P0  : -9.37281e-03 ± 2.65246e-02
  ADC_P1  : 8.60514e-03 ± 6.73024e-04
  ADC_P2  : -5.64103e-06 ± 3.40486e-06
  CSA_Chi2/NDF : 1.59135e-04 / 2
  CSA_P0  : 6.15661e-02 ± 8.41404e-03
  CSA_P1  : 1.02729e-02 ± 6.33937e-04
  CSA_P2  : -5.96868e-05 ± 9.65412e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [5, 7, 11, 32, 46, 77, 83, 93, 100, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [20, 24, 25, 65, 66, 78, 81, 91, 101, 107, 108, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1996', '1.800', '0.1468', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1724319058.6819332]
VI_after__Init : ['1.201', '0.1995', '1.800', '0.1468', '1.802', '0.0838', '7.000', '0.7078', 1, 1, 1, 1, 1724319066.7823038]
VI_at__the_End : ['1.201', '0.4643', '1.800', '0.1395', '1.808', '0.1204', '7.000', '0.7086', 1, 1, 1, 1, 1724319129.7701912]