TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_42_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-021-08 | FUSED_ID : 6359364768384442712
  IC_TEMP :  -70.60 | VDDM : 1123.51 | AUX_INT :   -8.56 | CsaBias :   59.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17210e-03 / 2
  ADC_P0  : -8.56085e-03 ± 2.31523e-02
  ADC_P1  : 8.57016e-03 ± 5.73134e-04
  ADC_P2  : -6.52599e-06 ± 2.81232e-06
  CSA_Chi2/NDF : 1.46417e-04 / 2
  CSA_P0  : 5.95522e-02 ± 8.07083e-03
  CSA_P1  : 1.03406e-02 ± 6.08079e-04
  CSA_P2  : -6.03497e-05 ± 9.26032e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 8, 27, 34, 47, 51, 52, 78, 117, 119, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [27, 35, 37, 46, 50, 59, 74, 98, 99, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1516', '1.800', '0.1606', '1.800', '0.0855', '7.000', '0.7076', 1, 1, 1, 1, 1724319725.7273722]
VI_after__Init : ['1.201', '0.1516', '1.800', '0.1605', '1.800', '0.0798', '7.000', '0.7076', 1, 1, 1, 1, 1724319733.8796782]
VI_at__the_End : ['1.201', '0.4673', '1.800', '0.1378', '1.800', '0.1213', '7.000', '0.7084', 1, 1, 1, 1, 1724319799.7513316]