TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_43_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-022-08 | FUSED_ID : 6359364768384442728
  IC_TEMP :  -67.26 | VDDM : 1116.40 | AUX_INT :  -10.61 | CsaBias :   59.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76034e-03 / 2
  ADC_P0  : -1.06104e-02 ± 2.84457e-02
  ADC_P1  : 8.87868e-03 ± 7.29107e-04
  ADC_P2  : -6.63377e-06 ± 3.73034e-06
  CSA_Chi2/NDF : 1.66923e-04 / 2
  CSA_P0  : 6.18599e-02 ± 8.61748e-03
  CSA_P1  : 1.04748e-02 ± 6.49265e-04
  CSA_P2  : -6.05178e-05 ± 9.88754e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [21, 27, 30, 45, 56, 65, 66, 92, 100, 104, 116, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [4, 12, 18, 64, 66, 80, 81, 89, 94, 99, 102, 111, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1977', '1.800', '0.1456', '1.799', '0.0954', '7.000', '0.7086', 1, 1, 1, 1, 1724319820.5888276]
VI_after__Init : ['1.202', '0.1978', '1.800', '0.1457', '1.801', '0.0880', '7.000', '0.7075', 1, 1, 1, 1, 1724319828.7701657]
VI_at__the_End : ['1.201', '0.4753', '1.800', '0.1391', '1.799', '0.1202', '7.000', '0.7084', 1, 1, 1, 1, 1724319889.0143082]