TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_46_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-024-08 | FUSED_ID : 6359364768384442760
  IC_TEMP :  -61.12 | VDDM : 1115.58 | AUX_INT :   -8.93 | CsaBias :   65.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35929e-03 / 2
  ADC_P0  : -8.92929e-03 ± 2.49467e-02
  ADC_P1  : 8.31311e-03 ± 5.96188e-04
  ADC_P2  : -6.29646e-06 ± 2.82127e-06
  CSA_Chi2/NDF : 1.20239e-04 / 2
  CSA_P0  : 5.73464e-02 ± 7.31382e-03
  CSA_P1  : 9.40860e-03 ± 5.51044e-04
  CSA_P2  : -4.42737e-05 ± 8.39175e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 13, 23, 25, 42, 43, 47, 78, 79, 85, 91, 99, 111, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [5, 7, 11, 13, 16, 21, 41, 43, 52, 54, 63, 69, 87, 103, 111, 120, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1204', '1.800', '0.1134', '1.799', '0.0801', '7.000', '0.7080', 1, 1, 1, 1, 1724320011.5797772]
VI_after__Init : ['1.202', '0.1204', '1.800', '0.1134', '1.801', '0.0751', '7.000', '0.7078', 1, 1, 1, 1, 1724320020.4299939]
VI_at__the_End : ['1.201', '0.4705', '1.800', '0.1336', '1.803', '0.1153', '7.000', '0.7084', 1, 1, 1, 1, 1724320082.473039]