TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_48_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-006-025-08 | FUSED_ID : 6359364768384442776
  IC_TEMP :  -70.42 | VDDM : 1125.56 | AUX_INT :  -10.22 | CsaBias :   52.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76022e-03 / 2
  ADC_P0  : -1.02161e-02 ± 2.84462e-02
  ADC_P1  : 9.05635e-03 ± 7.42648e-04
  ADC_P2  : -7.10076e-06 ± 3.85890e-06
  CSA_Chi2/NDF : 1.84466e-04 / 2
  CSA_P0  : 5.92008e-02 ± 9.05900e-03
  CSA_P1  : 1.05104e-02 ± 6.82530e-04
  CSA_P2  : -6.14409e-05 ± 1.03941e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [21, 22, 42, 43, 49, 66, 73, 74, 84, 103, 104, 112, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 13, 22, 25, 69, 93, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4041', '1.800', '0.1134', '1.799', '0.1023', '7.000', '0.7078', 1, 1, 1, 1, 1724320108.1270587]
VI_after__Init : ['1.201', '0.4047', '1.800', '0.1134', '1.801', '0.0965', '7.000', '0.7077', 1, 1, 1, 1, 1724320116.267572]
VI_at__the_End : ['1.201', '0.4715', '1.800', '0.1370', '1.805', '0.1198', '7.000', '0.7084', 1, 1, 1, 1, 1724320176.3376827]