TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_23_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-006-02 | FUSED_ID : 6359364768384446562
  IC_TEMP :  -91.98 | VDDM : 1110.75 | AUX_INT :  -12.85 | CsaBias :   56.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.49620e-03 / 2
  ADC_P0  : -1.28549e-02 ± 3.39211e-02
  ADC_P1  : 8.69960e-03 ± 8.44784e-04
  ADC_P2  : -6.22792e-06 ± 4.23312e-06
  CSA_Chi2/NDF : 1.12230e-04 / 2
  CSA_P0  : 6.05479e-02 ± 7.06604e-03
  CSA_P1  : 1.08133e-02 ± 5.32375e-04
  CSA_P2  : -7.89288e-05 ± 8.10745e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 10, 24, 25, 26, 44, 45, 46, 47, 108, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [8, 11, 26, 28, 29, 46, 57, 62, 80, 84, 102, 106, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4086', '1.800', '0.1162', '1.799', '0.1004', '7.000', '0.7074', 1, 1, 1, 1, 1724322212.2262766]
VI_after__Init : ['1.202', '0.4126', '1.800', '0.1171', '1.799', '0.0946', '7.000', '0.7074', 1, 1, 1, 1, 1724322220.9925997]
VI_at__the_End : ['1.201', '0.4232', '1.800', '0.1370', '1.805', '0.1216', '7.000', '0.7083', 1, 1, 1, 1, 1724322287.6355774]