TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_18_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-009-02 | FUSED_ID : 6359364768384446610
  IC_TEMP :  -69.32 | VDDM : 1115.60 | AUX_INT :  -12.16 | CsaBias :   74.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18375e-03 / 2
  ADC_P0  : -1.21649e-02 ± 3.16597e-02
  ADC_P1  : 8.68571e-03 ± 7.76401e-04
  ADC_P2  : -6.89695e-06 ± 3.80978e-06
  CSA_Chi2/NDF : 1.52802e-04 / 2
  CSA_P0  : 5.99018e-02 ± 8.24492e-03
  CSA_P1  : 1.00842e-02 ± 6.21195e-04
  CSA_P2  : -5.86659e-05 ± 9.46007e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 3, 7, 28, 42, 45, 47, 64, 65, 88, 93, 95, 107, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [4, 5, 8, 39, 43, 48, 51, 63, 67, 70, 71, 86, 87, 89, 108, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3760', '1.800', '0.1714', '1.799', '0.1041', '6.997', '0.7074', 1, 1, 1, 1, 1724321924.7201042]
VI_after__Init : ['1.202', '0.3779', '1.800', '0.1720', '1.801', '0.0978', '7.001', '0.7075', 1, 1, 1, 1, 1724321933.438396]
VI_at__the_End : ['1.201', '0.4575', '1.800', '0.1368', '1.802', '0.1206', '7.000', '0.7081', 1, 1, 1, 1, 1724321999.9814153]