TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_10_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-014-02 | FUSED_ID : 6359364768384446690
  IC_TEMP :  -66.90 | VDDM : 1120.18 | AUX_INT :   -9.59 | CsaBias :   67.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43453e-03 / 2
  ADC_P0  : -9.58565e-03 ± 2.56414e-02
  ADC_P1  : 8.64002e-03 ± 6.39024e-04
  ADC_P2  : -6.49349e-06 ± 3.16819e-06
  CSA_Chi2/NDF : 1.69149e-04 / 2
  CSA_P0  : 5.74383e-02 ± 8.67474e-03
  CSA_P1  : 1.03504e-02 ± 6.53579e-04
  CSA_P2  : -6.09832e-05 ± 9.95324e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 19, 31, 32, 58, 73, 77, 93, 94, 111, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [4, 23, 34, 39, 43, 45, 71, 90, 93, 97, 108, 113, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2445', '1.800', '0.1330', '1.799', '0.0909', '7.000', '0.7075', 1, 1, 1, 1, 1724321445.6281667]
VI_after__Init : ['1.202', '0.2444', '1.800', '0.1331', '1.801', '0.0851', '7.000', '0.7072', 1, 1, 1, 1, 1724321454.4714954]
VI_at__the_End : ['1.202', '0.4630', '1.800', '0.1370', '1.800', '0.1191', '7.000', '0.7083', 1, 1, 1, 1, 1724321522.037385]