TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_09_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-015-02 | FUSED_ID : 6359364768384446706
  IC_TEMP :  -72.17 | VDDM : 1120.81 | AUX_INT :  -10.67 | CsaBias :   58.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96004e-03 / 2
  ADC_P0  : -1.06738e-02 ± 3.00414e-02
  ADC_P1  : 8.75586e-03 ± 7.58205e-04
  ADC_P2  : -6.56912e-06 ± 3.81339e-06
  CSA_Chi2/NDF : 1.25448e-04 / 2
  CSA_P0  : 5.92450e-02 ± 7.47059e-03
  CSA_P1  : 1.04383e-02 ± 5.62855e-04
  CSA_P2  : -6.47309e-05 ± 8.57162e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [22, 37, 62, 63, 69, 78, 85, 86, 87, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  21
 | P_BROKEN_FAST :  [5, 15, 21, 23, 25, 29, 33, 38, 40, 45, 47, 50, 58, 63, 69, 91, 113, 115, 116, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3711', '1.800', '0.1509', '1.799', '0.1007', '7.000', '0.7070', 1, 1, 1, 1, 1724321350.7041526]
VI_after__Init : ['1.201', '0.3721', '1.800', '0.1510', '1.801', '0.0947', '7.000', '0.7072', 1, 1, 1, 1, 1724321358.8235874]
VI_at__the_End : ['1.201', '0.4551', '1.800', '0.1349', '1.805', '0.1223', '7.000', '0.7079', 1, 1, 1, 1, 1724321427.4634907]