TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_05_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-017-05 | FUSED_ID : 6359364768384446741
  IC_TEMP :  -66.82 | VDDM : 1124.43 | AUX_INT :   -8.64 | CsaBias :   65.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52681e-03 / 2
  ADC_P0  : -8.64038e-03 ± 2.64985e-02
  ADC_P1  : 8.30035e-03 ± 6.42146e-04
  ADC_P2  : -5.84764e-06 ± 3.08058e-06
  CSA_Chi2/NDF : 1.58144e-04 / 2
  CSA_P0  : 5.83704e-02 ± 8.38781e-03
  CSA_P1  : 9.92432e-03 ± 6.31961e-04
  CSA_P2  : -5.54242e-05 ± 9.62402e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [2, 6, 15, 22, 25, 26, 47, 49, 51, 62, 90, 93, 96, 98, 101, 106, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [15, 23, 48, 49, 53, 63, 73, 78, 82, 99, 116, 117, 118, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4172', '1.800', '0.1436', '1.799', '0.0978', '7.000', '0.7074', 1, 1, 1, 1, 1724321159.4613292]
VI_after__Init : ['1.201', '0.4177', '1.800', '0.1437', '1.801', '0.0923', '7.000', '0.7074', 1, 1, 1, 1, 1724321167.5967917]
VI_at__the_End : ['1.201', '0.4592', '1.800', '0.1355', '1.804', '0.1170', '7.000', '0.7081', 1, 1, 1, 1, 1724321233.194842]