TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_01_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-020-05 | FUSED_ID : 6359364768384446789
  IC_TEMP :  -63.66 | VDDM : 1115.62 | AUX_INT :   -9.39 | CsaBias :   62.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35827e-03 / 2
  ADC_P0  : -9.39326e-03 ± 2.48915e-02
  ADC_P1  : 9.01402e-03 ± 6.33625e-04
  ADC_P2  : -8.01973e-06 ± 3.19081e-06
  CSA_Chi2/NDF : 1.51577e-04 / 2
  CSA_P0  : 6.06363e-02 ± 8.21181e-03
  CSA_P1  : 1.00832e-02 ± 6.18701e-04
  CSA_P2  : -5.44033e-05 ± 9.42208e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [27, 32, 36, 39, 40, 41, 61, 79, 82, 84, 95, 109, 113, 117, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [18, 45, 52, 58, 69, 79, 91, 100, 102, 109, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1191', '1.800', '0.1422', '1.799', '0.0802', '7.000', '0.7076', 1, 1, 1, 1, 1724320872.4102294]
VI_after__Init : ['1.201', '0.1191', '1.800', '0.1423', '1.801', '0.0746', '7.000', '0.7076', 1, 1, 1, 1, 1724320880.5426528]
VI_at__the_End : ['1.201', '0.4730', '1.800', '0.1377', '1.799', '0.1163', '7.000', '0.7081', 1, 1, 1, 1, 1724320940.957325]