TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_59_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-021-05 | FUSED_ID : 6359364768384446805
  IC_TEMP :  -63.86 | VDDM : 1120.73 | AUX_INT :   -9.73 | CsaBias :   59.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35111e-03 / 2
  ADC_P0  : -9.73141e-03 ± 2.48190e-02
  ADC_P1  : 8.66597e-03 ± 6.07708e-04
  ADC_P2  : -7.24145e-06 ± 2.95373e-06
  CSA_Chi2/NDF : 1.28597e-04 / 2
  CSA_P0  : 5.72670e-02 ± 7.56377e-03
  CSA_P1  : 9.77000e-03 ± 5.69875e-04
  CSA_P2  : -5.13128e-05 ± 8.67853e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 10, 12, 19, 24, 29, 55, 60, 63, 71, 76, 98, 115, 117, 118, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 15, 22, 24, 27, 36, 50, 59, 64, 66, 67, 95, 99, 101, 102, 104, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2261', '1.800', '0.1551', '1.799', '0.0915', '7.000', '0.7077', 1, 1, 1, 1, 1724320777.13304]
VI_after__Init : ['1.201', '0.2262', '1.800', '0.1551', '1.801', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1724320785.871357]
VI_at__the_End : ['1.201', '0.4652', '1.800', '0.1327', '1.801', '0.1197', '7.000', '0.7082', 1, 1, 1, 1, 1724320844.6381593]