TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_58_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-022-05 | FUSED_ID : 6359364768384446821
  IC_TEMP :  -61.82 | VDDM : 1125.58 | AUX_INT :   -7.91 | CsaBias :   61.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47214e-03 / 2
  ADC_P0  : -7.90562e-03 ± 2.60861e-02
  ADC_P1  : 8.67362e-03 ± 6.81646e-04
  ADC_P2  : -5.22498e-06 ± 3.53594e-06
  CSA_Chi2/NDF : 1.60016e-04 / 2
  CSA_P0  : 6.19170e-02 ± 8.43731e-03
  CSA_P1  : 1.01058e-02 ± 6.35690e-04
  CSA_P2  : -5.63622e-05 ± 9.68081e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 5, 19, 29, 35, 43, 56, 61, 69, 86, 92, 93, 94, 100, 116, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [6, 47, 48, 58, 81, 90, 120, 122, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3478', '1.800', '0.1403', '1.799', '0.1002', '7.000', '0.7077', 1, 1, 1, 1, 1724320682.0006325]
VI_after__Init : ['1.201', '0.3479', '1.800', '0.1403', '1.801', '0.0943', '7.000', '0.7074', 1, 1, 1, 1, 1724320690.149115]
VI_at__the_End : ['1.201', '0.4713', '1.800', '0.1364', '1.799', '0.1186', '7.000', '0.7083', 1, 1, 1, 1, 1724320757.145378]