TEST_NAME : Wafer
TEST_DATE : 24_08_22-11_54_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-007-024-05 | FUSED_ID : 6359364768384446853
  IC_TEMP :  -68.38 | VDDM : 1128.04 | AUX_INT :  -10.03 | CsaBias :   61.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51525e-03 / 2
  ADC_P0  : -1.00320e-02 ± 2.63593e-02
  ADC_P1  : 8.99427e-03 ± 6.83999e-04
  ADC_P2  : -6.89897e-06 ± 3.53986e-06
  CSA_Chi2/NDF : 2.06710e-04 / 2
  CSA_P0  : 6.00613e-02 ± 9.58966e-03
  CSA_P1  : 1.07131e-02 ± 7.22512e-04
  CSA_P2  : -6.52966e-05 ± 1.10030e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [21, 24, 46, 47, 59, 67, 74, 98, 102, 105, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [10, 17, 63, 90, 102, 103, 106, 110, 116, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2728', '1.800', '0.1296', '1.799', '0.0933', '7.000', '0.7076', 1, 1, 1, 1, 1724320489.9077322]
VI_after__Init : ['1.201', '0.2730', '1.800', '0.1296', '1.800', '0.0880', '7.000', '0.7076', 1, 1, 1, 1, 1724320497.9542136]
VI_at__the_End : ['1.201', '0.4709', '1.800', '0.1384', '1.806', '0.1207', '7.000', '0.7083', 1, 1, 1, 1, 1724320566.18763]