TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_31_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-003-06 | FUSED_ID : 6359364768384450614
  IC_TEMP :  -68.81 | VDDM : 1122.92 | AUX_INT :  -11.93 | CsaBias :   80.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.22414e-03 / 2
  ADC_P0  : -1.19286e-02 ± 3.20208e-02
  ADC_P1  : 8.51019e-03 ± 7.82879e-04
  ADC_P2  : -5.99841e-06 ± 3.83987e-06
  CSA_Chi2/NDF : 1.68408e-04 / 2
  CSA_P0  : 5.89753e-02 ± 8.65574e-03
  CSA_P1  : 1.05333e-02 ± 6.52148e-04
  CSA_P2  : -6.24352e-05 ± 9.93144e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [3, 5, 13, 25, 31, 32, 33, 41, 45, 51, 60, 92, 94, 108, 119, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [14, 31, 57, 58, 75, 76, 77, 80, 89, 90, 110, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1600', '1.800', '0.1756', '1.799', '0.0896', '7.000', '0.7079', 1, 1, 1, 1, 1724322690.5504122]
VI_after__Init : ['1.202', '0.1600', '1.800', '0.1756', '1.800', '0.0842', '7.000', '0.7078', 1, 1, 1, 1, 1724322698.6347182]
VI_at__the_End : ['1.201', '0.4702', '1.800', '0.1395', '1.799', '0.1203', '7.000', '0.7086', 1, 1, 1, 1, 1724322765.064614]