TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_33_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-004-06 | FUSED_ID : 6359364768384450630
  IC_TEMP :  -63.88 | VDDM : 1099.44 | AUX_INT :   -9.36 | CsaBias :   69.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39382e-03 / 2
  ADC_P0  : -9.36253e-03 ± 2.52837e-02
  ADC_P1  : 8.81175e-03 ± 6.43590e-04
  ADC_P2  : -6.72295e-06 ± 3.25785e-06
  CSA_Chi2/NDF : 2.15301e-04 / 2
  CSA_P0  : 5.84408e-02 ± 9.78691e-03
  CSA_P1  : 1.02030e-02 ± 7.37373e-04
  CSA_P2  : -5.58040e-05 ± 1.12293e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [0, 2, 4, 5, 29, 34, 35, 53, 65, 67, 71, 98, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [18, 20, 34, 36, 47, 51, 62, 67, 70, 71, 91, 93, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2018', '1.800', '0.1430', '1.800', '0.0835', '7.000', '0.7080', 1, 1, 1, 1, 1724322785.9089904]
VI_after__Init : ['1.202', '0.2018', '1.800', '0.1430', '1.800', '0.0782', '7.000', '0.7079', 1, 1, 1, 1, 1724322794.016401]
VI_at__the_End : ['1.202', '0.4745', '1.800', '0.1381', '1.804', '0.1170', '7.000', '0.7089', 1, 1, 1, 1, 1724322856.9414256]