TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_34_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-005-06 | FUSED_ID : 6359364768384450646
  IC_TEMP :  -61.85 | VDDM : 1114.39 | AUX_INT :   -9.50 | CsaBias :   67.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69857e-03 / 2
  ADC_P0  : -9.50299e-03 ± 2.80175e-02
  ADC_P1  : 8.64636e-03 ± 7.17453e-04
  ADC_P2  : -5.50332e-06 ± 3.66513e-06
  CSA_Chi2/NDF : 1.73349e-04 / 2
  CSA_P0  : 6.09033e-02 ± 8.78178e-03
  CSA_P1  : 1.02355e-02 ± 6.61644e-04
  CSA_P2  : -5.90043e-05 ± 1.00760e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 10, 12, 22, 23, 60, 64, 67, 95, 98, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [23, 29, 33, 36, 42, 48, 53, 55, 61, 64, 66, 77, 98, 108, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2002', '1.800', '0.1746', '1.799', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1724322881.2986526]
VI_after__Init : ['1.202', '0.2001', '1.800', '0.1746', '1.800', '0.0810', '7.000', '0.7080', 1, 1, 1, 1, 1724322889.4939904]
VI_at__the_End : ['1.201', '0.4669', '1.800', '0.1387', '1.803', '0.1182', '7.000', '0.7089', 1, 1, 1, 1, 1724322949.36938]