TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_37_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-007-06 | FUSED_ID : 6359364768384450678
  IC_TEMP :  -72.72 | VDDM : 1100.97 | AUX_INT :  -12.20 | CsaBias :   50.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.45498e-03 / 2
  ADC_P0  : -1.22021e-02 ± 3.36448e-02
  ADC_P1  : 9.04875e-03 ± 8.68715e-04
  ADC_P2  : -7.11821e-06 ± 4.48833e-06
  CSA_Chi2/NDF : 1.77582e-04 / 2
  CSA_P0  : 5.96086e-02 ± 8.88835e-03
  CSA_P1  : 1.04658e-02 ± 6.69673e-04
  CSA_P2  : -6.45702e-05 ± 1.01983e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [21, 24, 32, 34, 42, 59, 65, 88, 107, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [2, 27, 38, 44, 45, 48, 53, 65, 68, 72, 79, 80, 82, 92, 100, 101, 122, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3396', '1.800', '0.1611', '1.799', '0.0998', '7.000', '0.7080', 1, 1, 1, 1, 1724323072.1648676]
VI_after__Init : ['1.202', '0.3400', '1.800', '0.1613', '1.801', '0.0942', '7.000', '0.7079', 1, 1, 1, 1, 1724323080.3602908]
VI_at__the_End : ['1.201', '0.4581', '1.800', '0.1375', '1.801', '0.1222', '7.000', '0.7086', 1, 1, 1, 1, 1724323148.9539561]