TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_41_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-009-06 | FUSED_ID : 6359364768384450710
  IC_TEMP :  -70.84 | VDDM : 1120.90 | AUX_INT :   -9.89 | CsaBias :   53.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55711e-03 / 2
  ADC_P0  : -9.89275e-03 ± 2.67031e-02
  ADC_P1  : 9.03890e-03 ± 6.88320e-04
  ADC_P2  : -7.57422e-06 ± 3.52053e-06
  CSA_Chi2/NDF : 1.78516e-04 / 2
  CSA_P0  : 5.91197e-02 ± 8.91172e-03
  CSA_P1  : 1.02949e-02 ± 6.71433e-04
  CSA_P2  : -6.12462e-05 ± 1.02251e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [15, 68, 76, 86, 95, 118, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 26, 34, 37, 48, 58, 85, 106, 117, 119, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3339', '1.800', '0.1631', '1.800', '0.1062', '7.000', '0.7076', 1, 1, 1, 1, 1724323263.6031983]
VI_after__Init : ['1.202', '0.3342', '1.800', '0.1632', '1.801', '0.1007', '7.000', '0.7076', 1, 1, 1, 1, 1724323272.286575]
VI_at__the_End : ['1.200', '0.4568', '1.800', '0.1383', '1.809', '0.1220', '7.000', '0.7082', 1, 1, 1, 1, 1724323331.4380279]