TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_42_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-010-06 | FUSED_ID : 6359364768384450726
  IC_TEMP :  -75.26 | VDDM : 1120.92 | AUX_INT :  -11.03 | CsaBias :   61.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86878e-03 / 2
  ADC_P0  : -1.10252e-02 ± 2.92966e-02
  ADC_P1  : 9.09813e-03 ± 7.63010e-04
  ADC_P2  : -7.23433e-06 ± 3.96826e-06
  CSA_Chi2/NDF : 1.58569e-04 / 2
  CSA_P0  : 6.21408e-02 ± 8.39908e-03
  CSA_P1  : 1.06411e-02 ± 6.32810e-04
  CSA_P2  : -6.77265e-05 ± 9.63695e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [12, 14, 20, 55, 59, 69, 71, 85, 88, 92, 97, 100, 109, 113, 117, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [13, 14, 41, 44, 55, 57, 59, 85, 102, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3259', '1.800', '0.1316', '1.799', '0.1008', '7.000', '0.7073', 1, 1, 1, 1, 1724323359.2758002]
VI_after__Init : ['1.201', '0.3265', '1.800', '0.1319', '1.800', '0.0947', '7.000', '0.7074', 1, 1, 1, 1, 1724323367.3011668]
VI_at__the_End : ['1.201', '0.4604', '1.800', '0.1401', '1.802', '0.1230', '7.000', '0.7081', 1, 1, 1, 1, 1724323427.9765232]