TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_44_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-011-06 | FUSED_ID : 6359364768384450742
  IC_TEMP :  -64.20 | VDDM : 1127.80 | AUX_INT :   -8.89 | CsaBias :   62.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25738e-03 / 2
  ADC_P0  : -8.89070e-03 ± 2.39766e-02
  ADC_P1  : 8.94436e-03 ± 6.15787e-04
  ADC_P2  : -7.29613e-06 ± 3.13433e-06
  CSA_Chi2/NDF : 1.80113e-04 / 2
  CSA_P0  : 5.83018e-02 ± 8.95148e-03
  CSA_P1  : 1.00744e-02 ± 6.74429e-04
  CSA_P2  : -5.53729e-05 ± 1.02708e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 20, 22, 28, 29, 31, 44, 50, 51, 59, 63, 78, 80, 82, 84, 91, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 9, 21, 28, 37, 52, 59, 73, 94, 115, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3360', '1.800', '0.1696', '1.800', '0.1002', '7.000', '0.7072', 1, 1, 1, 1, 1724323455.276489]
VI_after__Init : ['1.201', '0.3364', '1.800', '0.1697', '1.800', '0.0948', '7.000', '0.7072', 1, 1, 1, 1, 1724323463.3168516]
VI_at__the_End : ['1.201', '0.4705', '1.800', '0.1380', '1.801', '0.1178', '7.000', '0.7083', 1, 1, 1, 1, 1724323530.9536092]