TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_45_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-012-06 | FUSED_ID : 6359364768384450758
  IC_TEMP :  -65.90 | VDDM : 1133.25 | AUX_INT :   -8.36 | CsaBias :   68.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.51947e-04 / 2
  CSA_P0  : 5.98103e-02 ± 8.22183e-03
  CSA_P1  : 1.01319e-02 ± 6.19456e-04
  CSA_P2  : -5.66562e-05 ± 9.43358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [20, 27, 41, 45, 53, 71, 74, 75, 79, 80, 90, 94, 101, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [2, 11, 12, 18, 25, 32, 57, 66, 75, 99, 108, 111, 113, 119, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2268', '1.800', '0.1497', '1.800', '0.0919', '7.000', '0.7070', 1, 1, 1, 1, 1724323551.2330396]
VI_after__Init : ['1.201', '0.2266', '1.800', '0.1498', '1.802', '0.0863', '7.000', '0.7072', 1, 1, 1, 1, 1724323559.500451]
VI_at__the_End : ['1.202', '0.4690', '1.800', '0.1354', '1.801', '0.1187', '7.000', '0.7078', 1, 1, 1, 1, 1724323626.1163437]