TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_50_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-015-06 | FUSED_ID : 6359364768384450806
  IC_TEMP :  -64.80 | VDDM : 1130.45 | AUX_INT :   -7.65 | CsaBias :   52.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.42480e-04 / 2
  ADC_P0  : -7.65072e-03 ± 2.07515e-02
  ADC_P1  : 8.64919e-03 ± 5.22770e-04
  ADC_P2  : -6.48195e-06 ± 2.60609e-06
  CSA_Chi2/NDF : 1.25727e-04 / 2
  CSA_P0  : 6.00986e-02 ± 7.47890e-03
  CSA_P1  : 1.01005e-02 ± 5.63481e-04
  CSA_P2  : -5.59219e-05 ± 8.58115e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [2, 5, 9, 10, 21, 22, 29, 33, 41, 42, 46, 80, 86, 96, 97, 102, 103, 115, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [13, 18, 29, 35, 39, 50, 59, 61, 77, 83, 95, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2061', '1.800', '0.1567', '1.799', '0.0899', '7.000', '0.7072', 1, 1, 1, 1, 1724323832.6584792]
VI_after__Init : ['1.202', '0.2062', '1.800', '0.1566', '1.801', '0.0845', '7.000', '0.7072', 1, 1, 1, 1, 1724323840.7628791]
VI_at__the_End : ['1.201', '0.4705', '1.800', '0.1396', '1.800', '0.1181', '7.000', '0.7079', 1, 1, 1, 1, 1724323908.5557044]