TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_52_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-016-01 | FUSED_ID : 6359364768384450817
  IC_TEMP :  -58.66 | VDDM : 1105.66 | AUX_INT :   -9.07 | CsaBias :   66.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.18656e-04 / 2
  CSA_P0  : 5.92426e-02 ± 7.26554e-03
  CSA_P1  : 9.67935e-03 ± 5.47406e-04
  CSA_P2  : -4.85278e-05 ± 8.33634e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 9, 22, 31, 34, 36, 69, 77, 91, 93, 100, 119, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [8, 12, 27, 32, 36, 57, 67, 80, 97, 98, 100, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2428', '1.800', '0.1718', '1.800', '0.0864', '7.000', '0.7071', 1, 1, 1, 1, 1724323927.9701474]
VI_after__Init : ['1.202', '0.2428', '1.800', '0.1717', '1.800', '0.0810', '7.000', '0.7071', 1, 1, 1, 1, 1724323936.1765952]
VI_at__the_End : ['1.197', '0.4739', '1.800', '0.1366', '1.802', '0.1158', '7.000', '0.7078', 1, 1, 1, 1, 1724323993.5011623]