TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_53_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-017-01 | FUSED_ID : 6359364768384450833
  IC_TEMP :  -61.99 | VDDM : 1123.87 | AUX_INT :   -8.50 | CsaBias :   60.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51425e-03 / 2
  ADC_P0  : -8.50377e-03 ± 2.64360e-02
  ADC_P1  : 8.72722e-03 ± 6.86895e-04
  ADC_P2  : -5.65400e-06 ± 3.54580e-06
  CSA_Chi2/NDF : 1.47184e-04 / 2
  CSA_P0  : 6.14123e-02 ± 8.09194e-03
  CSA_P1  : 1.01773e-02 ± 6.09670e-04
  CSA_P2  : -5.61830e-05 ± 9.28455e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [9, 29, 44, 69, 82, 92, 94, 104, 107, 108, 117, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [0, 5, 8, 28, 34, 37, 46, 49, 59, 60, 63, 73, 76, 91, 98, 99, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4535', '1.800', '0.1493', '1.799', '0.1048', '7.000', '0.7070', 1, 1, 1, 1, 1724324022.5238929]
VI_after__Init : ['1.201', '0.4550', '1.800', '0.1495', '1.800', '0.0989', '7.000', '0.7071', 1, 1, 1, 1, 1724324031.2942266]
VI_at__the_End : ['1.201', '0.4753', '1.800', '0.1400', '1.803', '0.1174', '7.000', '0.7077', 1, 1, 1, 1, 1724324098.8371158]