TEST_NAME : Wafer
TEST_DATE : 24_08_22-12_55_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-018-01 | FUSED_ID : 6359364768384450849
  IC_TEMP :  -66.78 | VDDM : 1128.23 | AUX_INT :  -10.01 | CsaBias :   60.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54828e-03 / 2
  ADC_P0  : -1.00093e-02 ± 2.66182e-02
  ADC_P1  : 8.86941e-03 ± 6.71580e-04
  ADC_P2  : -7.35103e-06 ± 3.36351e-06
  CSA_Chi2/NDF : 1.49455e-04 / 2
  CSA_P0  : 6.06214e-02 ± 8.15413e-03
  CSA_P1  : 1.02490e-02 ± 6.14355e-04
  CSA_P2  : -5.78188e-05 ± 9.35590e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [24, 28, 35, 49, 72, 73, 78, 80, 109, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 9, 11, 20, 43, 47, 54, 56, 63, 66, 85, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1945', '1.800', '0.1615', '1.799', '0.0910', '7.001', '0.7078', 1, 1, 1, 1, 1724324118.3156435]
VI_after__Init : ['1.201', '0.1948', '1.800', '0.1616', '1.801', '0.0840', '7.000', '0.7072', 1, 1, 1, 1, 1724324126.3790114]
VI_at__the_End : ['1.201', '0.4718', '1.800', '0.1375', '1.804', '0.1195', '7.000', '0.7078', 1, 1, 1, 1, 1724324193.262764]