TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_01_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-022-01 | FUSED_ID : 6359364768384450913
  IC_TEMP :  -67.11 | VDDM : 1123.98 | AUX_INT :   -8.72 | CsaBias :   53.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27212e-03 / 2
  ADC_P0  : -8.71726e-03 ± 2.41088e-02
  ADC_P1  : 8.95666e-03 ± 6.17155e-04
  ADC_P2  : -7.57419e-06 ± 3.12312e-06
  CSA_Chi2/NDF : 1.66080e-04 / 2
  CSA_P0  : 6.12081e-02 ± 8.59571e-03
  CSA_P1  : 1.03859e-02 ± 6.47624e-04
  CSA_P2  : -5.95516e-05 ± 9.86255e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [8, 21, 30, 32, 37, 43, 56, 59, 72, 78, 84, 92, 99, 108, 116, 117, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [21, 22, 25, 29, 42, 50, 52, 55, 58, 60, 62, 70, 95, 106, 120, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2162', '1.800', '0.1136', '1.799', '0.0879', '7.000', '0.7072', 1, 1, 1, 1, 1724324495.8382447]
VI_after__Init : ['1.202', '0.2162', '1.800', '0.1135', '1.800', '0.0821', '7.000', '0.7074', 1, 1, 1, 1, 1724324503.9806607]
VI_at__the_End : ['1.201', '0.4749', '1.800', '0.1380', '1.804', '0.1182', '7.000', '0.7082', 1, 1, 1, 1, 1724324571.7478023]