TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_03_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-023-01 | FUSED_ID : 6359364768384450929
  IC_TEMP :  -63.26 | VDDM : 1124.83 | AUX_INT :  -10.17 | CsaBias :   58.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52033e-03 / 2
  ADC_P0  : -1.01733e-02 ± 2.63767e-02
  ADC_P1  : 8.68476e-03 ± 6.53723e-04
  ADC_P2  : -6.86377e-06 ± 3.22547e-06
  CSA_Chi2/NDF : 1.66089e-04 / 2
  CSA_P0  : 5.95354e-02 ± 8.59593e-03
  CSA_P1  : 1.05541e-02 ± 6.47641e-04
  CSA_P2  : -6.15223e-05 ± 9.86281e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 36, 49, 50, 63, 95, 99, 105, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 22, 57, 58, 70, 72, 107, 109, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2827', '1.800', '0.1599', '1.799', '0.0931', '7.000', '0.7083', 1, 1, 1, 1, 1724324591.9364722]
VI_after__Init : ['1.202', '0.2828', '1.800', '0.1599', '1.801', '0.0849', '7.000', '0.7075', 1, 1, 1, 1, 1724324599.935874]
VI_at__the_End : ['1.201', '0.4753', '1.800', '0.1394', '1.804', '0.1189', '7.000', '0.7083', 1, 1, 1, 1, 1724324659.2576277]