TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_06_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-008-025-01 | FUSED_ID : 6359364768384450961
  IC_TEMP :  -62.01 | VDDM : 1122.46 | AUX_INT :   -9.03 | CsaBias :   64.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42009e-03 / 2
  ADC_P0  : -9.02575e-03 ± 2.55786e-02
  ADC_P1  : 8.25580e-03 ± 6.25866e-04
  ADC_P2  : -5.04972e-06 ± 3.05307e-06
  CSA_Chi2/NDF : 1.71047e-04 / 2
  CSA_P0  : 6.00589e-02 ± 8.72329e-03
  CSA_P1  : 1.00943e-02 ± 6.57237e-04
  CSA_P2  : -5.55789e-05 ± 1.00089e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [4, 6, 15, 27, 32, 34, 37, 39, 50, 59, 71, 72, 74, 83, 96, 113, 115, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [7, 12, 39, 51, 90, 106, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4319', '1.800', '0.1178', '1.799', '0.1030', '7.000', '0.7076', 1, 1, 1, 1, 1724324783.023729]
VI_after__Init : ['1.201', '0.4329', '1.800', '0.1183', '1.801', '0.0969', '7.000', '0.7075', 1, 1, 1, 1, 1724324791.234092]
VI_at__the_End : ['1.201', '0.4703', '1.800', '0.1342', '1.804', '0.1177', '7.000', '0.7086', 1, 1, 1, 1, 1724324860.2400239]