TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_50_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-002-11 | FUSED_ID : 6359364768384454699
  IC_TEMP :  -70.85 | VDDM : 1115.72 | AUX_INT :  -11.18 | CsaBias :   49.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.01337e-03 / 2
  ADC_P0  : -1.11797e-02 ± 3.04035e-02
  ADC_P1  : 8.65192e-03 ± 7.45012e-04
  ADC_P2  : -7.01154e-06 ± 3.63253e-06
  CSA_Chi2/NDF : 1.98110e-04 / 2
  CSA_P0  : 5.96346e-02 ± 9.38805e-03
  CSA_P1  : 1.04329e-02 ± 7.07322e-04
  CSA_P2  : -6.20155e-05 ± 1.07717e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [1, 22, 27, 47, 48, 57, 68, 77, 107, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [7, 8, 19, 21, 22, 27, 29, 31, 35, 47, 51, 62, 64, 67, 83, 95, 99, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3973', '1.800', '0.1392', '1.799', '0.0997', '7.000', '0.7076', 1, 1, 1, 1, 1724327449.9911807]
VI_after__Init : ['1.201', '0.3980', '1.800', '0.1394', '1.800', '0.0936', '7.000', '0.7077', 1, 1, 1, 1, 1724327458.1744473]
VI_at__the_End : ['1.201', '0.4658', '1.800', '0.1379', '1.804', '0.1197', '7.000', '0.7085', 1, 1, 1, 1, 1724327525.9031968]