TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_47_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-004-11 | FUSED_ID : 6359364768384454731
  IC_TEMP :  -67.49 | VDDM : 1121.84 | AUX_INT :   -8.27 | CsaBias :   53.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15595e-03 / 2
  ADC_P0  : -8.26860e-03 ± 2.30077e-02
  ADC_P1  : 8.88667e-03 ± 5.94271e-04
  ADC_P2  : -6.87967e-06 ± 3.03975e-06
  CSA_Chi2/NDF : 2.07443e-04 / 2
  CSA_P0  : 6.00185e-02 ± 9.60665e-03
  CSA_P1  : 1.02106e-02 ± 7.23791e-04
  CSA_P2  : -5.72460e-05 ± 1.10225e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [2, 10, 16, 19, 43, 46, 47, 53, 60, 73, 76, 85, 89, 92, 93, 103, 116, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [19, 20, 24, 34, 48, 50, 62, 66, 73, 82, 94, 97, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2766', '1.800', '0.1813', '1.799', '0.0954', '7.000', '0.7077', 1, 1, 1, 1, 1724327258.7532773]
VI_after__Init : ['1.201', '0.2767', '1.800', '0.1814', '1.800', '0.0895', '7.000', '0.7078', 1, 1, 1, 1, 1724327266.8424735]
VI_at__the_End : ['1.201', '0.4722', '1.800', '0.1411', '1.802', '0.1209', '7.000', '0.7084', 1, 1, 1, 1, 1724327325.6149607]