TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_46_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-005-11 | FUSED_ID : 6359364768384454747
  IC_TEMP :  -60.07 | VDDM : 1123.31 | AUX_INT :  -10.38 | CsaBias :   71.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77764e-03 / 2
  ADC_P0  : -1.03822e-02 ± 2.85991e-02
  ADC_P1  : 8.24525e-03 ± 6.82197e-04
  ADC_P2  : -5.73796e-06 ± 3.24384e-06
  CSA_Chi2/NDF : 1.49704e-04 / 2
  CSA_P0  : 6.00168e-02 ± 8.16092e-03
  CSA_P1  : 1.03090e-02 ± 6.14866e-04
  CSA_P2  : -5.70648e-05 ± 9.36369e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [14, 15, 21, 35, 47, 57, 59, 72, 81, 82, 83, 84, 89, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [2, 24, 33, 51, 52, 56, 61, 63, 66, 71, 90, 112, 114, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3983', '1.800', '0.1531', '1.800', '0.0955', '7.000', '0.7076', 1, 1, 1, 1, 1724327162.5789196]
VI_after__Init : ['1.201', '0.3986', '1.800', '0.1532', '1.799', '0.0896', '7.000', '0.7077', 1, 1, 1, 1, 1724327170.7451696]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1384', '1.802', '0.1163', '7.000', '0.7087', 1, 1, 1, 1, 1724327231.6303947]