TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_44_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-006-11 | FUSED_ID : 6359364768384454763
  IC_TEMP :  -65.88 | VDDM : 1122.54 | AUX_INT :   -9.40 | CsaBias :   59.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41319e-03 / 2
  ADC_P0  : -9.40339e-03 ± 2.54418e-02
  ADC_P1  : 8.64676e-03 ± 6.32015e-04
  ADC_P2  : -6.74675e-06 ± 3.11576e-06
  CSA_Chi2/NDF : 1.52307e-04 / 2
  CSA_P0  : 6.11397e-02 ± 8.23156e-03
  CSA_P1  : 1.00952e-02 ± 6.20188e-04
  CSA_P2  : -5.60760e-05 ± 9.44473e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [2, 21, 22, 27, 32, 40, 53, 54, 57, 64, 72, 80, 89, 105, 114, 118, 120, 123, 125, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 12, 19, 24, 52, 53, 61, 64, 75, 80, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2873', '1.800', '0.1471', '1.800', '0.0370', '7.000', '0.7058', 1, 1, 1, 1, 1724327067.354453]
VI_after__Init : ['1.201', '0.2876', '1.800', '0.1473', '1.800', '0.0893', '7.000', '0.7078', 1, 1, 1, 1, 1724327075.349904]
VI_at__the_End : ['1.201', '0.4703', '1.800', '0.1380', '1.808', '0.1198', '7.000', '0.7082', 1, 1, 1, 1, 1724327136.0559828]