TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_41_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-008-11 | FUSED_ID : 6359364768384454795
  IC_TEMP :  -59.49 | VDDM : 1100.73 | AUX_INT :   -9.79 | CsaBias :   66.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45130e-03 / 2
  ADC_P0  : -9.79236e-03 ± 2.57822e-02
  ADC_P1  : 8.49296e-03 ± 6.29346e-04
  ADC_P2  : -6.38357e-06 ± 3.05730e-06
  CSA_Chi2/NDF : 1.44836e-04 / 2
  CSA_P0  : 6.04724e-02 ± 8.02713e-03
  CSA_P1  : 1.00384e-02 ± 6.04786e-04
  CSA_P2  : -5.26644e-05 ± 9.21018e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [1, 3, 4, 16, 17, 25, 42, 65, 66, 67, 70, 81, 90, 105, 110, 111, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [1, 5, 46, 52, 53, 60, 69, 76, 86, 99, 104, 111, 116, 117, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3309', '1.800', '0.1395', '1.799', '0.0883', '7.000', '0.7076', 1, 1, 1, 1, 1724326881.5916183]
VI_after__Init : ['1.201', '0.3295', '1.800', '0.1397', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1724326889.7228594]
VI_at__the_End : ['1.201', '0.4796', '1.800', '0.1392', '1.800', '0.1164', '7.000', '0.7087', 1, 1, 1, 1, 1724326957.7402627]