TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_38_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-010-11 | FUSED_ID : 6359364768384454827
  IC_TEMP :  -59.45 | VDDM : 1123.99 | AUX_INT :  -21.21 | CsaBias :   57.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.60809e-03 / 2
  ADC_P0  : -2.12075e-02 ± 3.53461e-02
  ADC_P1  : 8.74823e-03 ± 8.74921e-04
  ADC_P2  : -6.51535e-06 ± 4.33455e-06
  CSA_Chi2/NDF : 1.56370e-04 / 2
  CSA_P0  : 6.26448e-02 ± 8.34062e-03
  CSA_P1  : 1.05842e-02 ± 6.28406e-04
  CSA_P2  : -6.12494e-05 ± 9.56987e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 37, 41, 48, 52, 65, 87, 104, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 9, 18, 45, 60, 67, 78, 88, 117, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4135', '1.800', '0.1604', '1.800', '0.0945', '7.000', '0.7077', 1, 1, 1, 1, 1724326690.6232543]
VI_after__Init : ['1.201', '0.4136', '1.800', '0.1606', '1.801', '0.0887', '7.000', '0.7076', 1, 1, 1, 1, 1724326698.7785866]
VI_at__the_End : ['1.201', '0.4849', '1.800', '0.1386', '1.799', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1724326759.2785585]