TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_33_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-013-11 | FUSED_ID : 6359364768384454875
  IC_TEMP :  -58.95 | VDDM : 1120.71 | AUX_INT :   -9.61 | CsaBias :   74.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53145e-03 / 2
  ADC_P0  : -9.60737e-03 ± 2.65528e-02
  ADC_P1  : 8.45767e-03 ± 6.59682e-04
  ADC_P2  : -5.54331e-06 ± 3.26879e-06
  CSA_Chi2/NDF : 1.31563e-04 / 2
  CSA_P0  : 5.98538e-02 ± 7.65050e-03
  CSA_P1  : 1.00210e-02 ± 5.76410e-04
  CSA_P2  : -5.32906e-05 ± 8.77804e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 13, 18, 19, 22, 25, 29, 30, 44, 54, 75, 80, 99, 108, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [10, 11, 18, 22, 36, 39, 76, 107, 108, 113, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4281', '1.800', '0.1592', '1.799', '0.0950', '7.000', '0.7073', 1, 1, 1, 1, 1724326402.07049]
VI_after__Init : ['1.201', '0.4287', '1.800', '0.1600', '1.801', '0.0888', '7.000', '0.7075', 1, 1, 1, 1, 1724326410.8528192]
VI_at__the_End : ['1.202', '0.4756', '1.800', '0.1397', '1.803', '0.1166', '7.000', '0.7082', 1, 1, 1, 1, 1724326477.0536392]