TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_26_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-017-12 | FUSED_ID : 6359364768384454940
  IC_TEMP :  -71.36 | VDDM : 1116.94 | AUX_INT :   -9.84 | CsaBias :   50.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46191e-03 / 2
  ADC_P0  : -9.83636e-03 ± 2.58932e-02
  ADC_P1  : 8.63496e-03 ± 6.47406e-04
  ADC_P2  : -6.28284e-06 ± 3.22809e-06
  CSA_Chi2/NDF : 1.55498e-04 / 2
  CSA_P0  : 6.05617e-02 ± 8.31735e-03
  CSA_P1  : 1.05839e-02 ± 6.26652e-04
  CSA_P2  : -6.55703e-05 ± 9.54317e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [10, 45, 55, 64, 66, 70, 77, 83, 93, 101, 124, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [9, 18, 29, 31, 41, 53, 61, 65, 68, 96, 97, 106, 110, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4151', '1.800', '0.1742', '1.799', '0.0940', '7.000', '0.7072', 1, 1, 1, 1, 1724326018.8845155]
VI_after__Init : ['1.201', '0.4158', '1.800', '0.1744', '1.800', '0.0882', '7.000', '0.7072', 1, 1, 1, 1, 1724326026.957915]
VI_at__the_End : ['1.201', '0.4602', '1.800', '0.1376', '1.808', '0.1185', '7.000', '0.7080', 1, 1, 1, 1, 1724326093.431882]