TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_25_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-018-12 | FUSED_ID : 6359364768384454956
  IC_TEMP :  -71.55 | VDDM : 1121.58 | AUX_INT :  -10.02 | CsaBias :   60.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62982e-03 / 2
  ADC_P0  : -1.00188e-02 ± 2.74011e-02
  ADC_P1  : 8.80255e-03 ± 7.08773e-04
  ADC_P2  : -5.87019e-06 ± 3.66609e-06
  CSA_Chi2/NDF : 1.37811e-04 / 2
  CSA_P0  : 6.08734e-02 ± 7.83004e-03
  CSA_P1  : 1.05827e-02 ± 5.89937e-04
  CSA_P2  : -6.39099e-05 ± 8.98404e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [12, 22, 27, 54, 64, 68, 89, 97, 115, 121, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 2, 8, 23, 45, 52, 57, 72, 75, 86, 108, 109, 117, 119, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3426', '1.800', '0.1265', '1.799', '0.0939', '7.000', '0.7075', 1, 1, 1, 1, 1724325923.1117144]
VI_after__Init : ['1.201', '0.3430', '1.800', '0.1268', '1.800', '0.0878', '7.000', '0.7076', 1, 1, 1, 1, 1724325931.9399903]
VI_at__the_End : ['1.201', '0.4677', '1.800', '0.1408', '1.803', '0.1206', '7.000', '0.7081', 1, 1, 1, 1, 1724325997.9679754]